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revisions ltr description date (yr-mo-da) approved a drawing updated to reflect current requirements. -ro 02-05-28 r. monnin b update drawing as part of 5 year review. -rrp 09-05-18 j. rodenbeck rev sheet rev sheet rev status rev b b b b b b b b b b b of sheets sheet 1 2 3 4 5 6 7 8 9 10 11 pmic n/a prepared by rick c. officer defense supply center columbus standard microcircuit drawing checked by charles e. besore columbus, ohio 43218-3990 http://www.d scc.dla.mil this drawing is available for use by all departments approved by michael a. frye microcircuit, linear, high speed, low power, operational amplifier, monolithic silicon and agencies of the department of defense drawing approval date 93-01-19 amsc n/a revision level b size a cage code 67268 5962-89647 sheet 1 of 11 dscc form 2233 apr 97 5962-e004-08
standard microcircuit drawing size a 5962-89647 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 2 dscc form 2234 apr 97 1. scope 1.1 scope . this drawing describes device requirements for mil- std-883 compliant, non-jan class level b microcircuits in accordance with mil-prf-38535, appendix a. 1.2 part or identifying number (pin) . the complete pin is as shown in the following example: 5962-89647 01 p x drawing number device type (see 1.2.1) case outline (see 1.2.2) lead finish (see 1.2.3) 1.2.1 device type(s) . the device type(s) identify the circuit function as follows: device type generic number circuit function 01 ad847s high speed, low power, operational amplifier 1.2.2 case outline(s) . the case outline(s) are as des ignated in mil-std-1835 and as follows: outline letter descriptive designator terminals package style p gdip1-t8 or cdip2-t8 8 dual-in-line 1.2.3 lead finish . the lead finish is as spec ified in mil-prf-38535, appendix a. 1.3 absolute maximum ratings . (unless otherwise specified, t a = +25 ? c) positive supply voltage (+v s ) ........................................................ + 18 v dc negative supply voltage (-v s ) ........................................................ - 18 v dc differential input vo ltage ................................................................ 6.0 v dc input common m ode voltage ......................................................... v s junction temperature (t j ) .............................................................. +175 ? c storage temperat ure range ............................................................ -65 ? c to +150 ? c power dissipation (p d ) .................................................................. 1.1 w 1 / lead temperature (solderi ng, 10 seconds ) .................................... +300 ? c thermal resistance, junction-to-case ( ? jc ) ..................................... see mil-std-1835 thermal resistance, junction-to-ambient ( ? ja ) ................................ 110 ? c/w 1.4 recommended operating conditions . positive supply voltage range (+v s ) ............................................... +4.5 v dc to +15 v dc negative supply voltage range (-v s ) .............................................. -4.5 v dc to -15 v dc common mode input voltage (v cm ) ............................................... 12 v dc ambient operating temperature range(t a ) ..................................... -55 ? c to +125 ? c 1 / derate linearity above t a = +25 ? c at 7.3 mw/ ? c.
standard microcircuit drawing size a 5962-89647 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 3 dscc form 2234 apr 97 2. applicable documents 2.1 government specif ication, standards, and handbooks . the following specificati on, standards, and handbooks form a part of this drawing to the extent specified herein. unless otherwise specified, the issues of thes e documents are those cited in t he solicitation or contract. department of defense specification mil-prf-38535 - integrated circuits, manufacturing, general specification for. department of defense standards mil-std-883 - test met hod standard microcircuits. mil-std-1835 - interface standard electronic component case outlines. department of defense handbooks mil-hdbk-103 - list of st andard microcircuit drawings. mil-hdbk-780 - standard microcircuit drawings. (copies of these document s are available online at http://assist.daps.dla.mil/quicksearch/ or from the standardization document order desk, 700 robbins avenue, building 4d, philadelphia, pa 19111-5094.) 2.2 order of precedence . in the event of a conflict betw een the text of this drawing and the references cited herein, the text of this drawing takes precedence. nothing in this docum ent, however, supersedes applicable laws and regulations unless a specific exempti on has been obtained. 3. requirements 3.1 item requirements . the individual item requirements shall be in accordance with mil-prf-38535, appendix a for non- jan class level b devices and as specified herein. product built to this drawing t hat is produced by a q ualified manufacturer listing (qml) certified and qualif ied manufacturer or a manufacturer who has been granted transitional ce rtification to mil- prf-38535 may be processed as qml product in accordance wi th the manufacturers approv ed program plan and qualifying activity approval in accordance with mil-prf-38535. this qml flow as documented in the quality management (qm) plan may make modifications to the requirements herein. these modifi cations shall not affect form, fit, or function of the device. these modifications shall not affect the pi n as described herein. a "q" or "qml" ce rtification mark in accordance with mil- prf-38535 is required to identify w hen the qml flow option is used. 3.2 design, construction, and physical dimensions . the design, construction, and physica l dimensions shall be as specified in mil-prf-38535, appendix a and herein. 3.2.1 case outline . the case outline shall be in accordance with 1.2.2 herein. 3.2.2 terminal connections . the terminal connections shall be as specified on figure 1. 3.3 electrical performance characteristics . unless otherwise specified herein, the electrical performance characteristics are as specified in table i and shall apply over the full ambient operati ng temperature range. 3.4 electrical test requirements . the electrical test requirements shall be the subgroups specified in table ii. the electrical tests for each subgroup are described in table i. 3.5 marking . marking shall be in accordance with mil-prf-38535, appendix a. the part shall be marked with the pin listed in 1.2 herein. in addition, the manufactu rer's pin may also be marked. for pack ages where marking of the entire smd pin number is not feasible due to space limit ations, the manufacturer has the option of not marki ng the "5962-" on the device. 3.5.1 certificat ion/compliance mark . a compliance indicator ?c? shall be marked on all non-jan devices built in compliance to mil-prf-38535, appendix a. the compliance indicator ?c? sha ll be replaced with a "q" or "q ml" certification mark in accordance with mil-prf-38535 to identif y when the qml flow option is used.
standard microcircuit drawing size a 5962-89647 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 4 dscc form 2234 apr 97 table i. electrical performance characteristics . test symbol conditions 1 / -55 ? c ? t a ?? +125 ? c unless otherwise specified group a subgroups device type limits 2 / unit min max input offset voltage v io v cm = 0 v, v s = ? 5 v 1 01 ? 1.0 mv 2,3 ? 4.0 input bias current +i ib v cm = 0 v, v s = ? 5 v, 1 01 +5.0 ? a v s = ? 15 v 2,3 +7.5 -i ib 1 +5.0 2,3 +7.5 input offset current i io v cm = 0 v, 1 01 ? 300 na v s = ? 5 v, ? 15 v 2,3 ? 400 common mode input 3 / voltage range +ivr v cm = +2.5 v, v s = ? 5 v 1,2,3 01 +2.5 v -ivr v cm = -2.5 v, v s = ? 5 v -2.5 +ivr v cm = +12 v, v s = ? 15 v +12 -ivr v cm = -12 v, v s = ? 15 v -12 open loop gain +a vol v out = +2.5 v, 1 01 2.0 v/mv v s = ? 5 v, r l = 500 ? 2,3 1.0 v out = +10 v, 1 3.0 v s = ? 15 v, r l = 1 k ? 2,3 1.5 see footnotes at end of table.
standard microcircuit drawing size a 5962-89647 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 5 dscc form 2234 apr 97 table i. electrical performance characteristics ? continued. test symbol conditions 1 / -55 ? c ? t a ?? +125 ? c unless otherwise specified group a subgroups device type limits 2 / unit min max open loop gain -a vol v out = -2.5 v, 1 01 2.0 v/mv v s = ? 5 v, r l = 500 ? 2,3 1.0 v out = -10 v, 1 3.0 v s = ? 15 v, r l = 1 k ? 2,3 1.5 common mode rejection ratio +cmrr v cm = +2.5 v, v s = ? 5 v 1 01 80 db v cm = +12 v, v s = ? 15 v 1 80 2,3 75 -cmrr v cm = -2.5 v, v s = ? 5 v 1 80 v cm = -12 v, v s = ? 15 v 1 80 2,3 75 output current 4 / i out v out = ? 2.5 v, v s = ? 5 v, t a = +25 ? c 4 01 13 ma v out = ? 10 v, v s = ? 15 v, t a = +25 ? c 20 output voltage swing +v out v s = ? 5 v, r l = 500 ? 1 01 +3.0 v 2,3 +2.5 v s = ? 5 v, r l = 150 ? 1 +2.5 v s = ? 15 v, r l = 1 k ? 1,2,3 +12 v s = ? 15 v, r l = 500 ? 1 +10 see footnotes at end of table.
standard microcircuit drawing size a 5962-89647 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 6 dscc form 2234 apr 97 table i. electrical performance characteristics ? continued. test symbol conditions 1 / -55 ? c ? t a ?? +125 ? c unless otherwise specified group a subgroups device type limits 2 / unit min max output voltage swing -v out v s = ? 5 v, r l = 500 ? 1 01 -3.0 v 2,3 -2.5 v s = ? 5 v, r l = 150 ? 1 -2.5 v s = ? 15 v, r l = 1 k ? 1,2,3 -12 v s = ? 15 v, r l = 500 ? 1 -10 quiescent power supply current i cc v out = 0 v, i out = 0 ma, 1 01 5.7 ma v s = ? 5 v 2,3 7.8 v out = 0 v, i out = 0 ma, 1 6.3 v s = ? 15 v 2,3 8.4 power supply rejection ratio psrr v s = ? 5 v to ? 15 v 1 01 75 db 2,3 72 quiescent power 5 / consumption p q v out = 0 v, i out = 0 ma, 1 01 57 mw v s = ? 5 v 2,3 78 v out = 0 v, i out = 0 ma, 1 189 v s = ? 15 v 2,3 252 differential input 4 / resistance r in v cm = 0 v, t a = +25 ? c, v s = ? 5 v, ? 15 v 4 01 80 k ? see footnotes at end of table.
standard microcircuit drawing size a 5962-89647 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 7 dscc form 2234 apr 97 table i. electrical performance characteristics ? continued. test symbol conditions 1 / -55 ? c ? t a ?? +125 ? c unless otherwise specified group a subgroups device type limits 2 / unit min max slew rate 4 / 6 / +sr v out = -2.5 v to +2.5 v, r l = 500 ? , a v = 1 v/v, 4 01 120 v/ ? s v s = ? 5 v, measured from 10 % to 90 % point, rising edge 5,6 90 -sr v out = +2.5 v to -2.5 v, r l = 500 ? , a v = 1 v/v, 4 90 v s = ? 5 v, measured from 90 % to 10 % point, falling edge 5,6 65 +sr v out = -5 v to +5 v, r l = 1 k ? , a v = 1 v/v, 4 200 v s = ? 15 v, measured from 10 % to 90 % point, rising edge 5,6 130 -sr v out = +5 v to -5 v, r l = 1 k ? , a v = 1 v/v, 4 145 v s = ? 15 v, measured from 90 % to 10 % point, falling edge 5,6 120 gain bandwidth 4 / product gbwp v out = ? 100 mv, r l = 500 ? , v s = ? 5 v, t a = +25 ? c 4 01 25 mhz v out = ? 100 mv, r l = 1 k ? , v s = ? 15 v, t a = +25 ? c 40 full power 4 / 7 / bandwidth fpbw v pk = 2.5 v, r l = 500 ? , v s = ? 5 v, t a = +25 ? c 4 01 5.7 mhz v pk = 10 v, r l = 1 k ? , v s = ? 15 v, t a = +25 ? c 2.8 closed loop stable 4 / gain clsg v s = ? 5 v, ? 15 v, r l = 1 k ? 4,5,6 01 1.0 v/v see footnotes at end of table.
standard microcircuit drawing size a 5962-89647 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 8 dscc form 2234 apr 97 table i. electrical performance characteristics ? continued. test symbol conditions 1 / -55 ? c ? t a ?? +125 ? c unless otherwise specified group a subgroups device type limits 2 / unit min max rise time 4 / 8 / t r v out = 0 v to +200 mv, a v = +1, r l = 1 k ? , v s = ? 15 v 4,5,6 01 10 ns fall time 4 / 8 / t f v out = 0 v to -200 mv, a v = +1, r l = 1 k ? , v s = ? 15 v 4,5,6 01 10 ns settling time 4 / t s a v = -1 v/v, r l = 1 k ? , v s = ? 15 v, t a = +25 ? c, 10 v step at 0.1% of the fixed value 4 01 150 ns a v = -1 v/v, r l = 1 k ? , v s = ? 15 v, t a = +25 ? c, 10 v step at 0.01% of the fixed value 200 overshoot 4 / +os v out = 0 v to +200 mv, a v = +1, r l = 1 k ? , v s = ? 15 v, t a = +25 ? c 4 01 30 % -os v out = 0 v to -200 mv, a v = +1, r l = 1 k ? , v s = ? 15 v, t a = +25 ? c 30 1 / unless otherwise specified, for dc tests, r s ? 100 ? , r l ? 100 k ? , v out = 0 v, and c l ? 10 pf. unless otherwise specified, for ac tests, a v = 1 v/v, r l = 1 k ? , and c l ? 10 pf. 2 / the limiting terms "min" (minimum) and "max" (maximu m) shall be considered to apply to magnitudes only. negative current shall be def ined as conventional current fl ow out of a device terminal. 3 / this test is guaranteed by testing cmrr. 4 / if not tested, shall be guaranteed to t he limits specified in table i herein. 5 / quiescent power consumption is based on quiescent supply current test maximum (no load at the output). 6 / slew rate test limits are guar antee after 5 minutes of warm-up. 7 / full power bandwidth = sr / (2 x ? x v pk ). 8 / rise and fall times measured betw een 10 percent and 90 percent point.
standard microcircuit drawing size a 5962-89647 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 9 dscc form 2234 apr 97 device type 01 case outline p terminal number terminal symbol 1 null 2 -input 3 +input 4 -v s 5 nc 6 output 7 +v s 8 null nc = no connection figure 1. terminal connections .
standard microcircuit drawing size a 5962-89647 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 10 dscc form 2234 apr 97 3.6 certificate of compliance . a certificate of compliance shall be required from a manufactu rer in order to be listed as an approved source of supply in mil-hdbk-103 (s ee 6.6 herein). the certificate of co mpliance submitted to dscc-va prior to listing as an approved source of supply sha ll affirm that the manufacturer's product meets the requirement s of mil-prf-38535, appendix a and the requirements herein. 3.7 certificate of conformance . a certificate of conformance as requi red in mil-prf-38535, appendix a shall be provided with each lot of microcircuits delivered to this drawing. 3.8 notification of change . notification of change to dscc-va shall be requi red for any change that affects this drawing. 3.9 verification and review . dscc, dscc's agent, and the acquiring activity re tain the option to review the manufacturer's facility and applicable required doc umentation. offshore documentat ion shall be made available ons hore at the option of the reviewer. 4. verification 4.1 sampling and inspection . sampling and inspection procedures sha ll be in accordance with mil-prf-38535, appendix a. 4.2 screening . screening shall be in accordance with method 5004 of mil-std-883, and shall be conducted on all devices prior to quality conformance inspection. the following additional criteria shall apply: a. burn-in test, method 1015 of mil-std-883. (1) test condition b. the test circuit shall be maintai ned by the manufacturer under doc ument revision level control and shall be made available to the preparing or acquiring ac tivity upon request. the test circuit shall specify the inputs, outputs, biases, and pow er dissipation, as applicable, in accordanc e with the intent s pecified in method 1015 of mil-std-883. (2) t a = +125 ? c, minimum. b. interim and final electrical test parameters shall be as specified in table ii herein, ex cept interim electrical paramet er tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 quality conf ormance inspection . quality conformance inspection shall be in accordance with method 5005 of mil-std- 883 including groups a, b, c, and d inspections. the following additional criteria shall apply. 4.3.1 group a inspection . a. tests shall be as spec ified in table ii herein. b. subgroups 7, 8, 9, 10, and 11 in table i, method 5005 of mil-std-883 shall be omitted. 4.3.2 groups c and d inspections . a. end-point electrical parameters s hall be as specified in table ii herein. b. steady-state life test condi tions, method 1005 of mil-std-883. (1) test condition b. the test circuit shall be maintai ned by the manufacturer under doc ument revision level control and shall be made available to the preparing or acquiring ac tivity upon request. the test circuit shall specify the inputs, outputs, biases, and pow er dissipation, as applicable, in accordanc e with the intent specified in method 1005 of mil-std-883. (2) t a = +125 ? c, minimum. (3) test duration: 1,000 hour s, except as permitted by method 1005 of mil-std-883.
standard microcircuit drawing size a 5962-89647 defense supply center columbus columbus, ohio 43218-3990 revision level b sheet 11 dscc form 2234 apr 97 table ii. electrical test requirements . mil-std-883 test requirements subgroups (in accordance with mil-std-883, method 5005, table i) interim electrical parameters (method 5004) 1 final electrical test parameters (method 5004) 1*,2,3,4,5,6 group a test requirements (method 5005) 1,2,3,4,5,6 groups c and d end-point electrical parameters (method 5005) 1,2,3 * pda applies to subgroup 1. 5. packaging 5.1 packaging requirements . the requirements for packaging shall be in accordance with mil-prf-38535, appendix a. 6. notes 6.1 intended use . microcircuits conforming to this drawing are int ended for use for government microcircuit applications (original equipment), design applic ations, and logistics purposes. 6.2 replaceability . microcircuits covered by this drawing will repl ace the same generic device covered by a contractor- prepared specificati on or drawing. 6.3 configuration control of smd's . all proposed changes to existing smd's will be coordinated with the users of record for the individual documents. this c oordination will be accomplished using dd form 1692, engineering change proposal. 6.4 record of users . military and industrial users shall inform defens e supply center columbus (dscc) when a system application requires configurati on control and the applicable smd. dscc will main tain a record of users and this list will be used for coordination and distribution of c hanges to the drawings. users of drawi ngs covering microelectronics devices (fsc 5962) should contact dscc- va, telephone (614) 692-0544. 6.5 comments . comments on this drawing should be directed to dscc-va, columbus, ohio 43218-3990, or telephone (614) 692-0547 6.6 approved sources of supply . approved sources of supply are listed in mil-hdbk-103. the vendors listed in mil- hdbk-103 have agreed to this drawing and a ce rtificate of compliance (s ee 3.6 herein) has been subm itted to and accepted by dscc-va.
standard microcircuit drawing bulletin date: 09-05-18 approved sources of supply for smd 5962-89647 are listed below for immediate acquisition information only and shall be added to mil-hdbk-103 and qml-38535 during the next re vision. mil-hdbk-103 and qml-38535 will be revised to include the addition or deletion of s ources. the vendors listed below have agr eed to this drawing and a certificate of compliance has been submitted to and accepted by dscc-va. this informati on bulletin is superseded by the next dated revision of mil-hdbk-103 and qml- 38535. dscc maintains an online databas e of all current sources of supply at http://www.d scc.dla.mil/programs/smcr/ . standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962-8964701pa 24355 ad847sq/883 1 / the lead finish shown for each pin representing a hermetic package is the most readily available from the manufacturer listed for that part. if the desired lead finish is not listed contact the vendor to determine its availability. 2 / caution . do not use this number for item acquisition. items acquired to this number may not satisfy the performance require ments of this drawing. vendor cage vendor name number and address 24355 analog devices route 1 industrial park p.o. box 9106 norwood, ma 02062 point of contact: 804 woburn street wilmington, ma 01887-3462 the information contained herein is di sseminated for convenience only and the government assumes no liability whats oever for any inaccuracies in the information bulletin.

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